You are here: Technical Reference > Test Control
Test Control provides functionality to allow certain features to be exercised.
There are two features available in Test Control:
TestEventGenerate - This feature allows you to generate test events. Executing sends a single TestEvent, which then populates the Event Test Data selector with the ID and the timestamp of when the event occurred.
TestPendingAck - This feature allows you to test the device's pending acknowledge feature. When this feature is written, the device waits for the corresponding time period in milliseconds before acknowledging the write.
Test0001 - This feature is for internal testing only.
If a test fails, an error is produced for the log.
|Test Event Generate||ICommand||WO||Guru||This command generates a test event and sends it to the host.|
|Test 0001||IInteger||RW||Expert||For testing only.|
Test Control Features
Test Event Generate
This command generates a test event and sends it to the host.
For testing only.
© 2015-2021 FLIR® Integrated Imaging Solutions Inc.
All rights reserved.
Legal | Contact Support