Test Configurations

STC I	Standard Testing Configuration I	The device under test is in complete darkness at an ambient temperature of approximately 23°C.
STC II	Standard Testing Configuration II	This configuration is the same as STC I except that the device under test is exposed to a flat field light source at a level that achieves 50% saturation.
STC III	Standard Testing Configuration III	This configuration is the same as STC I except that the device under test is connected to a collimated light source.
ETC I	Extended Temperature Configuration I	The device under test is required to be in complete darkness at an ambient temperature of 45°C. Testing is continuous for a period of 12 hours.
TCC I	Temperature Cycling Configuration I	The device under test is required to be in complete darkness through a series of temperature cycles between -10°C and 40°C. Testing is continuous for 4 hours.
TCC II	Temperature Cycling Configuration II	The device under test is required to be in complete darkness through a series of temperature cycles between -20°C and 60°C. Testing is continuous for 4 hours.
NPC I	Non-powered Configuration I	The device under test is required to be non-powered at an ambient temperature of approximately 23°C. Typical use of this is for many inspection and measurement operations.