STC I |
Standard Testing Configuration I |
The device under test is in complete darkness at an ambient
temperature of approximately 23°C. |
STC II |
Standard Testing Configuration II |
This configuration is the same as STC I except that the device
under test is exposed to a flat field light source at a level that achieves 50% saturation. |
STC III |
Standard Testing Configuration III |
This configuration is the same as STC I except that the
device under test is connected to a collimated light source. |
ETC I |
Extended Temperature Configuration I |
The device under test is required to be in complete
darkness at an ambient temperature of 45°C. Testing is continuous for a period of 12 hours. |
TCC I |
Temperature Cycling Configuration I |
The device under test is required to be in complete
darkness through a series of temperature cycles between -10°C and 40°C. Testing is continuous for 4
hours. |
TCC II |
Temperature Cycling Configuration II |
The device under test is required to be in complete
darkness through a series of temperature cycles between -20°C and 60°C. Testing is continuous for 4
hours. |
NPC I |
Non-powered Configuration I |
The device under test is required to be non-powered at an
ambient temperature of approximately 23°C. Typical use of this is for many inspection and
measurement operations. |