Test Configurations

STC I Standard Testing Configuration I The device under test is in complete darkness at an ambient temperature of approximately 23°C.
STC II Standard Testing Configuration II This configuration is the same as STC I except that the device under test is exposed to a flat field light source at a level that achieves 50% saturation.
STC III Standard Testing Configuration III This configuration is the same as STC I except that the device under test is connected to a collimated light source.
ETC I Extended Temperature Configuration I The device under test is required to be in complete darkness at an ambient temperature of 45°C. Testing is continuous for a period of 12 hours.
TCC I Temperature Cycling Configuration I The device under test is required to be in complete darkness through a series of temperature cycles between -10°C and 40°C. Testing is continuous for 4 hours.
TCC II Temperature Cycling Configuration II The device under test is required to be in complete darkness through a series of temperature cycles between -20°C and 60°C. Testing is continuous for 4 hours.
NPC I Non-powered Configuration I The device under test is required to be non-powered at an ambient temperature of approximately 23°C. Typical use of this is for many inspection and measurement operations.