FLIR
Blackfly®S BFS-U3-200S6 |
Test Configurations
STC I | Standard Testing Configuration I | The device under test is in complete darkness at an ambient temperature of approximately 23°C. |
STC II | Standard Testing Configuration II | This configuration is the same as STC I except that the device under test is exposed to a flat field light source at a level that achieves 50% saturation. |
STC III | Standard Testing Configuration III | This configuration is the same as STC I except that the device under test is connected to a collimated light source. |
ETC I | Extended Temperature Configuration I | The device under test is required to be in complete darkness at an ambient temperature of 45°C. Testing is continuous for a period of 12 hours. |
TCC I | Temperature Cycling Configuration I | The device under test is required to be in complete darkness through a series of temperature cycles between -10°C and 40°C. Testing is continuous for 4 hours. |
TCC II | Temperature Cycling Configuration II | The device under test is required to be in complete darkness through a series of temperature cycles between -20°C and 60°C. Testing is continuous for 4 hours. |
NPC I | Non-powered Configuration I | The device under test is required to be non-powered at an ambient temperature of approximately 23°C. Typical use of this is for many inspection and measurement operations. |
8/31/2017
© 2015-2017 FLIR® Integrated Imaging Solutions Inc. All rights reserved. Legal | Contact Support |
Blackfly®S BFS-U3-200S6 |
|